Economical Fast Focus Scanning Systems for Microscopy and Metrology Applications
Thursday, April 18, 2024
Packages with controller, software, and nano-focus scanner offer an excellent price-performance ratio - new from PI.
AUBURN, Mass., April 10, 2024 /PRNewswire-PRWeb/ -- PI, a global leader in nanopositioning instrumentation, has extended its PIFOC series of microscopy products by two new economical nano-focus scanner packages for applications including surface metrology, super-resolution microscopy, light sheet microscopy, digital slide scanning, etc.
Two scanning ranges are currently available, the P-725.1CDE1S offers 100µm and the P-725.4CDE1S offers 400µm. The fast scanners are based on a closed-loop piezo flexure design with capacitive position feedback for high linearity, stability, and repeatability. A compact digital controller with software is included.
Features
-- Travel range: 100 or 400 m
-- Settling time: <= 19 or <= 35ms
-- Point repeatability, 10% step, 1 sigma: <= 20nm
-- Large clear aperture with Ø 29mm
-- Outstanding lifetime thanks to PICMA® piezo actuators
-- Nanometer resolution due to capacitive sensors
-- High guide accuracy due to zero-play flexure guides
-- Controller included
Industries Served
Surface metrology, semiconductor inspection, genome sequencing, 3D imaging, digital slide scanning, super-resolution microscopy, light sheet microscopy, fluorescence microscopy, interferometry, autofocus systems
PI Americas
https://www.pi-usa.us | info@pi-usa.us | (508) 832-3456
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Media Contact
Controller, software, and nano-focus scanner packages, PI (Physik Instrumente) LP, (508) 832-3456, press-release@pi-usa.us, https://www.pi-usa.us
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SOURCE PI (Physik Instrumente) LP
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